APA (7th ed.) Citation

Xu, S. H., Wu, H. S., Tong, S. Y., Keeffe, M., Lapeyre, G. J., & Rotenberg, E. (2003). STUDY OF THE C[sub 2]H[sub 4]/Si(100)-(2×1) INTERFACE BY DERIVATIVE PHOTOELECTRON HOLOGRAPHY. Surface Review & Letters, 10(6), 925. https://doi.org/10.1142/S0218625X03005670

Chicago Style (17th ed.) Citation

Xu, S. H., H. S. Wu, S. Y. Tong, M. Keeffe, G. J. Lapeyre, and E. Rotenberg. "STUDY OF THE C[sub 2]H[sub 4]/Si(100)-(2×1) INTERFACE BY DERIVATIVE PHOTOELECTRON HOLOGRAPHY." Surface Review & Letters 10, no. 6 (2003): 925. https://doi.org/10.1142/S0218625X03005670.

MLA (9th ed.) Citation

Xu, S. H., et al. "STUDY OF THE C[sub 2]H[sub 4]/Si(100)-(2×1) INTERFACE BY DERIVATIVE PHOTOELECTRON HOLOGRAPHY." Surface Review & Letters, vol. 10, no. 6, 2003, p. 925, https://doi.org/10.1142/S0218625X03005670.