Plasmonic properties of implanted Ag nanoparticles in SiO2 thin layer by spectroscopic ellipsometry.

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Bibliographic Details
Title: Plasmonic properties of implanted Ag nanoparticles in SiO2 thin layer by spectroscopic ellipsometry.
Authors: Battie, Yann1, En Naciri, Aotmane1, aotmane.en-naciri@univ-lorraine.fr, Chaoui, Nouari1, Le Gall, Yann2, Muller, Dominique2, Carrada, Marzia3, Mathiot, Daniel2
Source: Journal of Applied Physics; 2017, Vol. 122 Issue 8, p1-10, 10p, 1 Color Photograph, 2 Diagrams, 1 Chart, 8 Graphs
Database: Applied Science & Technology Source
Description
ISSN:00218979
DOI:10.1063/1.4989793