APA (7th ed.) Citation

Battie, Y., En Naciri, A., Chaoui, N., Le Gall, Y., Muller, D., Carrada, M., & Mathiot, D. (2017). Plasmonic properties of implanted Ag nanoparticles in SiO2 thin layer by spectroscopic ellipsometry. Journal of Applied Physics, 122(8), 1. https://doi.org/10.1063/1.4989793

Chicago Style (17th ed.) Citation

Battie, Yann, Aotmane En Naciri, Nouari Chaoui, Yann Le Gall, Dominique Muller, Marzia Carrada, and Daniel Mathiot. "Plasmonic Properties of Implanted Ag Nanoparticles in SiO2 Thin Layer by Spectroscopic Ellipsometry." Journal of Applied Physics 122, no. 8 (2017): 1. https://doi.org/10.1063/1.4989793.

MLA (9th ed.) Citation

Battie, Yann, et al. "Plasmonic Properties of Implanted Ag Nanoparticles in SiO2 Thin Layer by Spectroscopic Ellipsometry." Journal of Applied Physics, vol. 122, no. 8, 2017, p. 1, https://doi.org/10.1063/1.4989793.