Characterization of TeO based glass frits and morphology to their silver films.
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| Title: | Characterization of TeO based glass frits and morphology to their silver films. |
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| Authors: | Cai, Xin1, Xiaoxin_CX239@163.com, Teng, Yuancheng1, tyc239@163.com, Wu, Lang1, Chan, Xiaohua2 |
| Source: | Journal of Materials Science: Materials in Electronics; Dec2017, Vol. 28 Issue 24, p18429-18436, 8p |
| Database: | Applied Science & Technology Source |
| ISSN: | 09574522 |
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| DOI: | 10.1007/s10854-017-7789-2 |