View in EDS PDF Full Text

Characterization of TeO based glass frits and morphology to their silver films.

Saved in:
Bibliographic Details
Title: Characterization of TeO based glass frits and morphology to their silver films.
Authors: Cai, Xin1, Xiaoxin_CX239@163.com, Teng, Yuancheng1, tyc239@163.com, Wu, Lang1, Chan, Xiaohua2
Source: Journal of Materials Science: Materials in Electronics; Dec2017, Vol. 28 Issue 24, p18429-18436, 8p
Database: Applied Science & Technology Source
FullText Links:
  – Type: pdflink
Text:
  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 126133348
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
IllustrationInfo
Items – Name: Title
  Label: Title
  Group: Ti
  Data: Characterization of TeO based glass frits and morphology to their silver films.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AU" term="%22Cai%2C+Xin%22">Cai, Xin</searchLink><relatesTo>1</relatesTo>, <i>Xiaoxin_CX239@163.com</i><br /><searchLink fieldCode="AU" term="%22Teng%2C+Yuancheng%22">Teng, Yuancheng</searchLink><relatesTo>1</relatesTo>, <i>tyc239@163.com</i><br /><searchLink fieldCode="AU" term="%22Wu%2C+Lang%22">Wu, Lang</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Chan%2C+Xiaohua%22">Chan, Xiaohua</searchLink><relatesTo>2</relatesTo>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22Journal+of+Materials+Science%3A+Materials+in+Electronics%22">Journal of Materials Science: Materials in Electronics</searchLink>; Dec2017, Vol. 28 Issue 24, p18429-18436, 8p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=126133348
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1007/s10854-017-7789-2
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 8
        StartPage: 18429
    Titles:
      – TitleFull: Characterization of TeO based glass frits and morphology to their silver films.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Cai, Xin
      – PersonEntity:
          Name:
            NameFull: Teng, Yuancheng
      – PersonEntity:
          Name:
            NameFull: Wu, Lang
      – PersonEntity:
          Name:
            NameFull: Chan, Xiaohua
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 15
              M: 12
              Text: Dec2017
              Type: published
              Y: 2017
          Identifiers:
            – Type: issn-print
              Value: 09574522
          Numbering:
            – Type: volume
              Value: 28
            – Type: issue
              Value: 24
          Titles:
            – TitleFull: Journal of Materials Science: Materials in Electronics
              Type: main
ResultId 1