Low-leakage sub-threshold 9 T-SRAM cell in 14-nm FinFET technology.

Saved in:
Bibliographic Details
Title: Low-leakage sub-threshold 9 T-SRAM cell in 14-nm FinFET technology.
Authors: Zeinali, Behzad1, beze@eng.au.dk, Madsen, Jens Kargaard1, Raghavan, Praveen2, Moradi, Farshad1
Source: International Journal of Circuit Theory & Applications; Nov2017, Vol. 45 Issue 11, p1647-1659, 13p
Database: Applied Science & Technology Source
Description
ISSN:00989886
DOI:10.1002/cta.2280