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DETERMINATION OF THE OVERLAYER/SUBSTRATE REGISTRY IN BY ANGLE-SCANNED PHOTOELECTRON DIFFRACTION.

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Bibliographic Details
Title: DETERMINATION OF THE OVERLAYER/SUBSTRATE REGISTRY IN BY ANGLE-SCANNED PHOTOELECTRON DIFFRACTION.
Authors: SAMBI, M.1, PIN, E.1, GRANOZZI, G.1
Source: Surface Review & Letters; Dec1995, Vol. 2 Issue 6, p787-793, 7p
Database: Applied Science & Technology Source
Description
ISSN:0218625X
DOI:10.1142/S0218625X95000716