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LEEM Determination of Critical Terrace Widths for Si/Si(111) Step Flow Growth.

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Bibliographic Details
Title: LEEM Determination of Critical Terrace Widths for Si/Si(111) Step Flow Growth.
Authors: Altman, M. S.1, Chung, W. F.1, Franz, T.1
Source: Surface Review & Letters; Feb1998, Vol. 5 Issue 1, p27-30, 4p
Database: Applied Science & Technology Source
Description
ISSN:0218625X
DOI:10.1142/S0218625X98000086