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LEEM Determination of Critical Terrace Widths for Si/Si(111) Step Flow Growth.

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Title: LEEM Determination of Critical Terrace Widths for Si/Si(111) Step Flow Growth.
Authors: Altman, M. S.1, Chung, W. F.1, Franz, T.1
Source: Surface Review & Letters; Feb1998, Vol. 5 Issue 1, p27-30, 4p
Database: Applied Science & Technology Source
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  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 126702013
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: LEEM Determination of Critical Terrace Widths for Si/Si(111) Step Flow Growth.
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RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1142/S0218625X98000086
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      – Code: eng
        Text: English
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        PageCount: 4
        StartPage: 27
    Titles:
      – TitleFull: LEEM Determination of Critical Terrace Widths for Si/Si(111) Step Flow Growth.
        Type: main
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          Name:
            NameFull: Altman, M. S.
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            NameFull: Chung, W. F.
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            NameFull: Franz, T.
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            – D: 01
              M: 02
              Text: Feb1998
              Type: published
              Y: 1998
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              Value: 0218625X
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              Value: 5
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            – TitleFull: Surface Review & Letters
              Type: main
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