APA (7th ed.) Citation

Engst, C. R., Rommel, M., Bscheid, C., Eisele, I., & Kutter, C. (2017). Bulk lifetime characterization of corona charged silicon wafers with high resistivity by means of microwave detected photoconductivity. Journal of Applied Physics, 122(21), 1. https://doi.org/10.1063/1.4993127

Chicago Style (17th ed.) Citation

Engst, C. R., M. Rommel, C. Bscheid, I. Eisele, and C. Kutter. "Bulk Lifetime Characterization of Corona Charged Silicon Wafers with High Resistivity by Means of Microwave Detected Photoconductivity." Journal of Applied Physics 122, no. 21 (2017): 1. https://doi.org/10.1063/1.4993127.

MLA (9th ed.) Citation

Engst, C. R., et al. "Bulk Lifetime Characterization of Corona Charged Silicon Wafers with High Resistivity by Means of Microwave Detected Photoconductivity." Journal of Applied Physics, vol. 122, no. 21, 2017, p. 1, https://doi.org/10.1063/1.4993127.