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Bulk lifetime characterization of corona charged silicon wafers with high resistivity by means of microwave detected photoconductivity.

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Title: Bulk lifetime characterization of corona charged silicon wafers with high resistivity by means of microwave detected photoconductivity.
Authors: Engst, C. R.1, Rommel, M.2, Bscheid, C.1, Eisele, I.1,3, Kutter, C.1,3
Source: Journal of Applied Physics; 12/7/2017, Vol. 122 Issue 21, p1-11, 11p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 126716987
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Bulk lifetime characterization of corona charged silicon wafers with high resistivity by means of microwave detected photoconductivity.
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Applied+Physics%22">Journal of Applied Physics</searchLink>; 12/7/2017, Vol. 122 Issue 21, p1-11, 11p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=126716987
RecordInfo BibRecord:
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      – Type: doi
        Value: 10.1063/1.4993127
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      – Code: eng
        Text: English
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        PageCount: 11
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      – TitleFull: Bulk lifetime characterization of corona charged silicon wafers with high resistivity by means of microwave detected photoconductivity.
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            NameFull: Engst, C. R.
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            NameFull: Rommel, M.
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            NameFull: Bscheid, C.
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            NameFull: Eisele, I.
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              M: 12
              Text: 12/7/2017
              Type: published
              Y: 2017
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              Value: 122
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