Ellipsometric and XPS analysis of the interface between silver and SiO2, TiO2 and SiNx thin films
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| Title: | Ellipsometric and XPS analysis of the interface between silver and SiO2, TiO2 and SiNx thin films |
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| Authors: | Masetti, E.1, masetti@casaccia.enea.it, Bulir, J.1,2, Gagliardi, S.1, Janicki, V.1, Krasilnikova, A.3, Di Santo, G.3, Coluzza, C.3 |
| Source: | Thin Solid Films; May2004, Vol. 455/456, p468, 5p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00406090 |
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| DOI: | 10.1016/j.tsf.2003.11.244 |
