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Ellipsometric and XPS analysis of the interface between silver and SiO2, TiO2 and SiNx thin films

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Title: Ellipsometric and XPS analysis of the interface between silver and SiO2, TiO2 and SiNx thin films
Authors: Masetti, E.1, masetti@casaccia.enea.it, Bulir, J.1,2, Gagliardi, S.1, Janicki, V.1, Krasilnikova, A.3, Di Santo, G.3, Coluzza, C.3
Source: Thin Solid Films; May2004, Vol. 455/456, p468, 5p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 12978028
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Ellipsometric and XPS analysis of the interface between silver and SiO2, TiO2 and SiNx thin films
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PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=12978028
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      – Type: doi
        Value: 10.1016/j.tsf.2003.11.244
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      – Code: eng
        Text: English
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        PageCount: 5
        StartPage: 468
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      – TitleFull: Ellipsometric and XPS analysis of the interface between silver and SiO2, TiO2 and SiNx thin films
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            NameFull: Masetti, E.
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            NameFull: Krasilnikova, A.
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            NameFull: Di Santo, G.
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            – D: 01
              M: 05
              Text: May2004
              Type: published
              Y: 2004
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              Value: 455/456
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