Autonomous Multicycle Tests With Low Storage and Test Application Time Overheads.
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| Title: | Autonomous Multicycle Tests With Low Storage and Test Application Time Overheads. |
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| Authors: | Pomeranz, Irith |
| Source: | IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems; Sep2018, Vol. 37 Issue 9, p1881-1892, 12p |
| Database: | Applied Science & Technology Source |
| ISSN: | 02780070 |
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| DOI: | 10.1109/TCAD.2017.2774269 |
