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Autonomous Multicycle Tests With Low Storage and Test Application Time Overheads.

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Bibliographic Details
Title: Autonomous Multicycle Tests With Low Storage and Test Application Time Overheads.
Authors: Pomeranz, Irith
Source: IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems; Sep2018, Vol. 37 Issue 9, p1881-1892, 12p
Database: Applied Science & Technology Source
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  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 131346525
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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Items – Name: Title
  Label: Title
  Group: Ti
  Data: Autonomous Multicycle Tests With Low Storage and Test Application Time Overheads.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AU" term="%22Pomeranz%2C+Irith%22">Pomeranz, Irith</searchLink>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22IEEE+Transactions+on+Computer-Aided+Design+of+Integrated+Circuits+%26+Systems%22">IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems</searchLink>; Sep2018, Vol. 37 Issue 9, p1881-1892, 12p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=131346525
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1109/TCAD.2017.2774269
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 12
        StartPage: 1881
    Titles:
      – TitleFull: Autonomous Multicycle Tests With Low Storage and Test Application Time Overheads.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Pomeranz, Irith
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 09
              Text: Sep2018
              Type: published
              Y: 2018
          Identifiers:
            – Type: issn-print
              Value: 02780070
          Numbering:
            – Type: volume
              Value: 37
            – Type: issue
              Value: 9
          Titles:
            – TitleFull: IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems
              Type: main
ResultId 1