Generalised residual stress depth profiling at the nanoscale using focused ion beam milling.
Saved in:
| Title: | Generalised residual stress depth profiling at the nanoscale using focused ion beam milling. |
|---|---|
| Authors: | Salvati, E.1, enrico.salvati@eng.ox.ac.uk, Romano-Brandt, L.1, Mughal, M.Z.2, Sebastiani, M.2, Korsunsky, A.M.1 |
| Source: | Journal of the Mechanics & Physics of Solids; Apr2019, Vol. 125, p488-501, 14p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00225096 |
|---|---|
| DOI: | 10.1016/j.jmps.2019.01.007 |
