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Generalised residual stress depth profiling at the nanoscale using focused ion beam milling.

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Title: Generalised residual stress depth profiling at the nanoscale using focused ion beam milling.
Authors: Salvati, E.1, enrico.salvati@eng.ox.ac.uk, Romano-Brandt, L.1, Mughal, M.Z.2, Sebastiani, M.2, Korsunsky, A.M.1
Source: Journal of the Mechanics & Physics of Solids; Apr2019, Vol. 125, p488-501, 14p
Database: Applied Science & Technology Source
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  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 135034482
AccessLevel: 2
PubType: Periodical
PubTypeId: serialPeriodical
PreciseRelevancyScore: 0
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+the+Mechanics+%26+Physics+of+Solids%22">Journal of the Mechanics & Physics of Solids</searchLink>; Apr2019, Vol. 125, p488-501, 14p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=135034482
RecordInfo BibRecord:
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      – Type: doi
        Value: 10.1016/j.jmps.2019.01.007
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      – Code: eng
        Text: English
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        PageCount: 14
        StartPage: 488
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      – TitleFull: Generalised residual stress depth profiling at the nanoscale using focused ion beam milling.
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            NameFull: Salvati, E.
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            NameFull: Romano-Brandt, L.
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            NameFull: Mughal, M.Z.
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            NameFull: Sebastiani, M.
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              Text: Apr2019
              Type: published
              Y: 2019
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              Value: 125
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