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Low-frequency noise and defects in copper and ruthenium resistors.

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Bibliographic Details
Title: Low-frequency noise and defects in copper and ruthenium resistors.
Authors: Fleetwood, D. M.1, Beyne, S.2,3, Jiang, R.1, Zhao, S. E.1, Wang, P.1, Bonaldo, S.4, McCurdy, M. W.1, Tőkei, Zs.3, DeWolf, I.2,3, Croes, Kristof3, Zhang, E. X.1, Alles, M. L.1, Schrimpf, R. D.1, Reed, R. A.1, Linten, D.3
Source: Applied Physics Letters; 2019, Vol. 114 Issue 20, pN.PAG-N.PAG, 5p, 1 Chart, 2 Graphs
Database: Applied Science & Technology Source
Description
ISSN:00036951
DOI:10.1063/1.5093549