Synergistic Effect of Plasma Discharge and Substrate Temperature in Improving the Crystallization of TiO2 Film by Atmospheric Pressure Plasma Enhanced Chemical Vapor Deposition.

Saved in:
Bibliographic Details
Title: Synergistic Effect of Plasma Discharge and Substrate Temperature in Improving the Crystallization of TiO2 Film by Atmospheric Pressure Plasma Enhanced Chemical Vapor Deposition.
Authors: Xu, Yu1, Zhang, Yu2, Li, Linjun2, Ding, Ke1,2, Guo, Ying2, Shi, Jianjun1,2, Huang, Xiaojiang2, Zhang, Jing1, jingzh@dhu.edu.cn
Source: Plasma Chemistry & Plasma Processing; Jul2019, Vol. 39 Issue 4, p937-947, 11p
Database: Applied Science & Technology Source
Full text is not displayed to guests.
Description
ISSN:02724324
DOI:10.1007/s11090-019-09961-0