High-temperature deep-level transient spectroscopy system for defect studies in wide-bandgap semiconductors.
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| Title: | High-temperature deep-level transient spectroscopy system for defect studies in wide-bandgap semiconductors. |
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| Authors: | Majdi, S.1, Saman.Majdi@angstrom.uu.se, Gabrysch, M.1, Suntornwipat, N.1, Burmeister, F.1, Jonsson, R.1, Kovi, K. K.1,2, Hallén, A.3,4 |
| Source: | Review of Scientific Instruments; Jun2019, Vol. 90 Issue 6, pN.PAG-N.PAG, 5p, 2 Diagrams, 3 Graphs |
| Database: | Applied Science & Technology Source |
| ISSN: | 00346748 |
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| DOI: | 10.1063/1.5097755 |
