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Farewell and thanks for all the reviews.

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Bibliographic Details
Title:	Farewell and thanks for all the reviews.
Authors:	Offutt, Jeff¹
Source:	Software Testing: Verification & Reliability; Jun-Aug2019, Vol. 29 Issue 4/5, pN.PAG-N.PAG, 1p
Database:	Applied Science & Technology Source
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Description
ISSN:	09600833
DOI:	10.1002/stvr.1711