Standardization of proton induced X-ray emission for analysis of trace elements in thick samples.

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Bibliographic Details
Title:	Standardization of proton induced X-ray emission for analysis of trace elements in thick samples.
Authors:	Zeb, Johar^1,2, Ali, Shad^1,2,3,4, Haneef, Muhammad¹, Naeem, Azhar Muhammad^2,3, Akbar, Jehan^1,2,4, Jehan@ictp.it
Source:	Canadian Journal of Physics; Aug2019, Vol. 97 Issue 8, p875-879, 5p
Database:	Applied Science & Technology Source

Description
ISSN:	00084204
DOI:	10.1139/cjp-2018-0522