Multispectroscopic Study of Single Xe Clusters Using XFEL Pulses.

Saved in:
Bibliographic Details
Title: Multispectroscopic Study of Single Xe Clusters Using XFEL Pulses.
Authors: Nishiyama, Toshiyuki1,2, fukuzawa@tohoku.ac.jpnishiyama.toshiyuki.68n@kyoto-u.jp, Bostedt, Christoph3,4,5,6, christoph.bostedt@psi.ch, Ferguson, Ken R.3, kferguson@exponent.com, Hutchison, Christopher1, chrisstopper@gmail.com, Nagaya, Kiyonobu1,2, hatsui@spring8.or.jpnagaya.kiyonobu.3r@kyoto-u.ac.jptsukasa.sakai@hkt.muratec.co.jp, Fukuzawa, Hironobu2,7, motomura@spring8.or.jpyabashi@spring8.or.jp, Motomura, Koji7, tach.ymn@gmail.com, Wada, Shin-ichi8, swada@sci.hiroshima-u.ac.jp, Sakai, Tsukasa1, matsunami.yaolab.kyoto@gmail.com, Matsunami, Kenji1, matsuda.kazuhiro.5u@kyoto-u.ac.jp, Matsuda, Kazuhiro1, Tachibana, Tetsuya7, y-ito@yz.yamagata-u.ac.jp, Ito, Yuta7, xuwq1@shanghaitech.edu.cn, Xu, Weiqing7, justsm@gmail.com, Mondal, Subhendu7, Umemoto, Takayuki8, yggbyby@gmail.com, Miron, Catalin9,10,11, catalin.p.miron@gmail.com, Nicolas, Christophe9, christophe.nicolas@synchrotron-soleil.fr, Kameshima, Takashi12, kameshima@spring8.or.jp, Joti, Yasumasa12, joti@spring8.or.jp
Source: Applied Sciences (2076-3417); Nov2019, Vol. 9 Issue 22, p4932, 10p
Database: Applied Science & Technology Source
Full text is not displayed to guests.
Description
ISSN:20763417
DOI:10.3390/app9224932