The electronics transport mechanism of grain and grain boundary in semiconductive hafnium oxynitride thin film.
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| Title: | The electronics transport mechanism of grain and grain boundary in semiconductive hafnium oxynitride thin film. |
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| Authors: | Lin, Zude1, Li, Xiuyan1, Zeng, Yujin1, You, Minmin1, Wang, Fangfang1, Liu, Jingquan1, jqliu@sjtu.edu.cn |
| Source: | Journal of Materials Science; Mar2020, Vol. 55 Issue 7, p2881-2890, 10p, 2 Color Photographs, 1 Chart, 5 Graphs |
| Database: | Applied Science & Technology Source |
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| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 140205839 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: The electronics transport mechanism of grain and grain boundary in semiconductive hafnium oxynitride thin film. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AU" term="%22Lin%2C+Zude%22">Lin, Zude</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Li%2C+Xiuyan%22">Li, Xiuyan</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Zeng%2C+Yujin%22">Zeng, Yujin</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22You%2C+Minmin%22">You, Minmin</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Wang%2C+Fangfang%22">Wang, Fangfang</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Liu%2C+Jingquan%22">Liu, Jingquan</searchLink><relatesTo>1</relatesTo>, <i>jqliu@sjtu.edu.cn</i> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Journal+of+Materials+Science%22">Journal of Materials Science</searchLink>; Mar2020, Vol. 55 Issue 7, p2881-2890, 10p, 2 Color Photographs, 1 Chart, 5 Graphs |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=140205839 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1007/s10853-019-03952-4 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 10 StartPage: 2881 Titles: – TitleFull: The electronics transport mechanism of grain and grain boundary in semiconductive hafnium oxynitride thin film. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Lin, Zude – PersonEntity: Name: NameFull: Li, Xiuyan – PersonEntity: Name: NameFull: Zeng, Yujin – PersonEntity: Name: NameFull: You, Minmin – PersonEntity: Name: NameFull: Wang, Fangfang – PersonEntity: Name: NameFull: Liu, Jingquan IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 03 Text: Mar2020 Type: published Y: 2020 Identifiers: – Type: issn-print Value: 00222461 Numbering: – Type: volume Value: 55 – Type: issue Value: 7 Titles: – TitleFull: Journal of Materials Science Type: main |
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