The electronics transport mechanism of grain and grain boundary in semiconductive hafnium oxynitride thin film.
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| Title: | The electronics transport mechanism of grain and grain boundary in semiconductive hafnium oxynitride thin film. |
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| Authors: | Lin, Zude1, Li, Xiuyan1, Zeng, Yujin1, You, Minmin1, Wang, Fangfang1, Liu, Jingquan1, jqliu@sjtu.edu.cn |
| Source: | Journal of Materials Science; Mar2020, Vol. 55 Issue 7, p2881-2890, 10p, 2 Color Photographs, 1 Chart, 5 Graphs |
| Database: | Applied Science & Technology Source |
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