Investigation on the formation technique of SiGe Fin for the high mobility channel FinFET device.

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Title: Investigation on the formation technique of SiGe Fin for the high mobility channel FinFET device.
Authors: Zhao, Zhiqian1,2, Cheng, Xiaohong1, Li, Yongliang1, liyongliang@ime.ac.cn, Zan, Ying1,2, Liu, Haoyan1,2, Wang, Guilei1, Du, Anyan1, Li, Junjie1,2, Zhang, Qingzhu1, Xu, Gaobo1, Ma, Xueli1, Wang, Xiaolei1, Yang, Hong1, Xu, Jing1, xujing@ime.ac.cn, Luo, Jun1,2, Li, JunFeng1, Yin, Huaxiang1, Wang, Wenwu1, wangwenwu@ime.ac.cn
Source: Journal of Materials Science: Materials in Electronics; Apr2020, Vol. 31 Issue 8, p5854-5860, 7p
Database: Applied Science & Technology Source
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ISSN:09574522
DOI:10.1007/s10854-019-02661-7