Accurate high‐resolution single‐crystal diffraction data from a Pilatus3 X CdTe detector.
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| Title: | Accurate high‐resolution single‐crystal diffraction data from a Pilatus3 X CdTe detector. |
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| Authors: | Krause, Lennard1, Tolborg, Kasper1, Grønbech, Thomas Bjørn Egede1, Sugimoto, Kunihisa2, Iversen, Bo Brummerstedt1, bo@chem.au.dk, Overgaard, Jacob1, jacobo@chem.au.dk |
| Source: | Journal of Applied Crystallography; Jun2020, Vol. 53 Issue 3, p635-649, 15p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00218898 |
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| DOI: | 10.1107/S1600576720003775 |
