On Border Traps in Back-Side-Illuminated CMOS Image Sensor Oxides.
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| Title: | On Border Traps in Back-Side-Illuminated CMOS Image Sensor Oxides. |
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| Authors: | Vici, Andrea1, andrea.vici@imec.be, Russo, Felice2, felice.russo@lfoundry.com, Lovisi, Nicola2, nicola.lovisi@lfoundry.com, Irrera, Fernanda1, fernanda.irrera@uniroma1.it |
| Source: | IEEE Transactions on Electron Devices; May2020, Vol. 67 Issue 5, p2022-2027, 6p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00189383 |
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| DOI: | 10.1109/TED.2020.2983039 |
