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On Border Traps in Back-Side-Illuminated CMOS Image Sensor Oxides.

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Title: On Border Traps in Back-Side-Illuminated CMOS Image Sensor Oxides.
Authors: Vici, Andrea1, andrea.vici@imec.be, Russo, Felice2, felice.russo@lfoundry.com, Lovisi, Nicola2, nicola.lovisi@lfoundry.com, Irrera, Fernanda1, fernanda.irrera@uniroma1.it
Source: IEEE Transactions on Electron Devices; May2020, Vol. 67 Issue 5, p2022-2027, 6p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 143858013
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: <searchLink fieldCode="JN" term="%22IEEE+Transactions+on+Electron+Devices%22">IEEE Transactions on Electron Devices</searchLink>; May2020, Vol. 67 Issue 5, p2022-2027, 6p
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RecordInfo BibRecord:
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      – Type: doi
        Value: 10.1109/TED.2020.2983039
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      – Code: eng
        Text: English
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        StartPage: 2022
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      – TitleFull: On Border Traps in Back-Side-Illuminated CMOS Image Sensor Oxides.
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            NameFull: Vici, Andrea
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            NameFull: Russo, Felice
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            NameFull: Lovisi, Nicola
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              Value: 67
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