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Micro‐Scale Device—An Alternative Route for Studying the Intrinsic Properties of Solid‐State Materials: The Case of Semiconducting TaGeIr.

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Title: Micro‐Scale Device—An Alternative Route for Studying the Intrinsic Properties of Solid‐State Materials: The Case of Semiconducting TaGeIr.
Authors: Antonyshyn, I.1, Wagner, F. R.1, Bobnar, M.1, Sichevych, O.1, Burkhardt, U.1, Schmidt, M.1, König, M.1, Poeppelmeier, K.2, Mackenzie, A. P.1, Svanidze, E.1, Grin, Yu.1, grin@cpfs.mpg.de
Source: Angewandte Chemie International Edition; 6/26/2020, Vol. 59 Issue 27, p11136-11141, 6p
Database: Applied Science & Technology Source
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ISSN:14337851
DOI:10.1002/anie.202002693