Messungen an μm‐Proben – ein alternativer Weg zur Untersuchung intrinsischer Eigenschaften von Festkörper‐Materialien am Beispiel des Halbleiters TaGeIr.
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| Title: | Messungen an μm‐Proben – ein alternativer Weg zur Untersuchung intrinsischer Eigenschaften von Festkörper‐Materialien am Beispiel des Halbleiters TaGeIr. |
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| Authors: | Antonyshyn, I.1, Wagner, F. R.1, Bobnar, M.1, Sichevych, O.1, Burkhardt, U.1, Schmidt, M.1, König, M.1, Poeppelmeier, K.2, Mackenzie, A. P.1, Svanidze, E.1, Grin, Yu.1, grin@cpfs.mpg.de |
| Source: | Angewandte Chemie; 6/26/2020, Vol. 132 Issue 27, p11230-11235, 6p |
| Database: | Applied Science & Technology Source |
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| FullText | Links: – Type: pdflink Text: Availability: 1 |
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| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 143890768 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Messungen an μm‐Proben – ein alternativer Weg zur Untersuchung intrinsischer Eigenschaften von Festkörper‐Materialien am Beispiel des Halbleiters TaGeIr. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AU" term="%22Antonyshyn%2C+I%2E%22">Antonyshyn, I.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Wagner%2C+F%2E+R%2E%22">Wagner, F. R.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Bobnar%2C+M%2E%22">Bobnar, M.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Sichevych%2C+O%2E%22">Sichevych, O.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Burkhardt%2C+U%2E%22">Burkhardt, U.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Schmidt%2C+M%2E%22">Schmidt, M.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22König%2C+M%2E%22">König, M.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Poeppelmeier%2C+K%2E%22">Poeppelmeier, K.</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Mackenzie%2C+A%2E+P%2E%22">Mackenzie, A. P.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Svanidze%2C+E%2E%22">Svanidze, E.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Grin%2C+Yu%2E%22">Grin, Yu.</searchLink><relatesTo>1</relatesTo>, <i>grin@cpfs.mpg.de</i> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Angewandte+Chemie%22">Angewandte Chemie</searchLink>; 6/26/2020, Vol. 132 Issue 27, p11230-11235, 6p |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=143890768 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1002/ange.202002693 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 6 StartPage: 11230 Titles: – TitleFull: Messungen an μm‐Proben – ein alternativer Weg zur Untersuchung intrinsischer Eigenschaften von Festkörper‐Materialien am Beispiel des Halbleiters TaGeIr. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Antonyshyn, I. – PersonEntity: Name: NameFull: Wagner, F. R. – PersonEntity: Name: NameFull: Bobnar, M. – PersonEntity: Name: NameFull: Sichevych, O. – PersonEntity: Name: NameFull: Burkhardt, U. – PersonEntity: Name: NameFull: Schmidt, M. – PersonEntity: Name: NameFull: König, M. – PersonEntity: Name: NameFull: Poeppelmeier, K. – PersonEntity: Name: NameFull: Mackenzie, A. P. – PersonEntity: Name: NameFull: Svanidze, E. – PersonEntity: Name: NameFull: Grin, Yu. IsPartOfRelationships: – BibEntity: Dates: – D: 26 M: 06 Text: 6/26/2020 Type: published Y: 2020 Identifiers: – Type: issn-print Value: 00448249 Numbering: – Type: volume Value: 132 – Type: issue Value: 27 Titles: – TitleFull: Angewandte Chemie Type: main |
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