Novel method for convenient Seebeck coefficient measurements on individual Si nanowires.
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| Title: | Novel method for convenient Seebeck coefficient measurements on individual Si nanowires. |
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| Authors: | Hu, X. F.1, Li, S. J.1, Lin, D. D.2, Xiong, F.3, Jiang, Z. M.1, Yang, X. J.1, xjyang@fudan.edu.cn |
| Source: | Journal of Applied Physics; 11/14/2020, Vol. 128 Issue 18, p1-9, 9p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00218979 |
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| DOI: | 10.1063/5.0024045 |
