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Reliable Technology Evaluation of SiGe HBTs and MOSFETs: fMAX Estimation From Measured Data.

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Title: Reliable Technology Evaluation of SiGe HBTs and MOSFETs: fMAX Estimation From Measured Data.
Authors: Saha, Bishwadeep1, bishwadeep.saha@ims-bordeaux.fr, Fregonese, Sebastien2, Heinemann, Bernd3, Scheer, Patrick4, Chevalier, Pascal4, Aufinger, Klaus5, Chakravorty, Anjan6, Zimmer, Thomas2
Source: IEEE Electron Device Letters; Jan2021, Vol. 42 Issue 1, p14-17, 4p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 148071887
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
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  Data: <searchLink fieldCode="AU" term="%22Saha%2C+Bishwadeep%22">Saha, Bishwadeep</searchLink><relatesTo>1</relatesTo>, <i>bishwadeep.saha@ims-bordeaux.fr</i><br /><searchLink fieldCode="AU" term="%22Fregonese%2C+Sebastien%22">Fregonese, Sebastien</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Heinemann%2C+Bernd%22">Heinemann, Bernd</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AU" term="%22Scheer%2C+Patrick%22">Scheer, Patrick</searchLink><relatesTo>4</relatesTo><br /><searchLink fieldCode="AU" term="%22Chevalier%2C+Pascal%22">Chevalier, Pascal</searchLink><relatesTo>4</relatesTo><br /><searchLink fieldCode="AU" term="%22Aufinger%2C+Klaus%22">Aufinger, Klaus</searchLink><relatesTo>5</relatesTo><br /><searchLink fieldCode="AU" term="%22Chakravorty%2C+Anjan%22">Chakravorty, Anjan</searchLink><relatesTo>6</relatesTo><br /><searchLink fieldCode="AU" term="%22Zimmer%2C+Thomas%22">Zimmer, Thomas</searchLink><relatesTo>2</relatesTo>
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  Data: <searchLink fieldCode="JN" term="%22IEEE+Electron+Device+Letters%22">IEEE Electron Device Letters</searchLink>; Jan2021, Vol. 42 Issue 1, p14-17, 4p
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        Value: 10.1109/LED.2020.3040891
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      – Code: eng
        Text: English
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        PageCount: 4
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      – TitleFull: Reliable Technology Evaluation of SiGe HBTs and MOSFETs: fMAX Estimation From Measured Data.
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            NameFull: Saha, Bishwadeep
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              Text: Jan2021
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              Y: 2021
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            – TitleFull: IEEE Electron Device Letters
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