A Compressive Sensing Framework for EMI Source Localization Using a Metalens Structure: Localization Beyond the Diffraction Limit.
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| Title: | A Compressive Sensing Framework for EMI Source Localization Using a Metalens Structure: Localization Beyond the Diffraction Limit. |
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| Authors: | Azadifar, Mohammad1, mohammad.azadifar@epfl.ch, Karami, Hamidreza1, hamidr.karami@gmail.com, Rachidi, Farhad1, farhad.rachidi@epfl.ch, Rubinstein, Marcos2, marcos.rubinstein@heig-vd.ch |
| Source: | IEEE Transactions on Electromagnetic Compatibility; Feb2022, Vol. 64 Issue 1, p58-65, 8p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00189375 |
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| DOI: | 10.1109/TEMC.2020.3041803 |
