Thermal Effects on Initial Volatile Response and Relaxation Dynamics of Resistive RAM Devices.

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Bibliographic Details
Title: Thermal Effects on Initial Volatile Response and Relaxation Dynamics of Resistive RAM Devices.
Authors: Abbey, Thomas1, ta5g14@ecs.soton.ac.uk, Giotis, Christos1, c.giotis@soton.ac.uk, Serb, Alex1, a.serb@soton.ac.uk, Stathopoulos, Spyros1, s.stathopoulos@soton.ac.uk, Prodromakis, Themis1, t.prodromakis@soton.ac.uk
Source: IEEE Electron Device Letters; Mar2022, Vol. 43 Issue 3, p386-389, 4p
Database: Applied Science & Technology Source
Description
ISSN:07413106
DOI:10.1109/LED.2022.3145620