The Impact of Hot Carrier Injection-Induced Device Degradation for Lower-Power FinFETs.
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| Title: | The Impact of Hot Carrier Injection-Induced Device Degradation for Lower-Power FinFETs. |
|---|---|
| Authors: | Chen, Yu-Lin1,2, Yeh, Wen-Kuan1,3, Hsu, Heng-Tung1, Chen, Ke-Horng2, Lien, Der-Hsien4, Lin, Wen-Chin5, Yu, Tien-Han1, Chiu, Yu-Sheng3, Godwinraj, D6, Godfrey, D3,7, Wu, Chien-Hung8, rossiwu@chu.edu.tw |
| Source: | Journal of Electronic Materials; Feb2023, Vol. 52 Issue 2, p1391-1399, 9p |
| Database: | Applied Science & Technology Source |
| FullText | Links: – Type: pdflink Text: Availability: 0 |
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| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 161192279 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: The Impact of Hot Carrier Injection-Induced Device Degradation for Lower-Power FinFETs. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AU" term="%22Chen%2C+Yu-Lin%22">Chen, Yu-Lin</searchLink><relatesTo>1,2</relatesTo><br /><searchLink fieldCode="AU" term="%22Yeh%2C+Wen-Kuan%22">Yeh, Wen-Kuan</searchLink><relatesTo>1,3</relatesTo><br /><searchLink fieldCode="AU" term="%22Hsu%2C+Heng-Tung%22">Hsu, Heng-Tung</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Chen%2C+Ke-Horng%22">Chen, Ke-Horng</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Lien%2C+Der-Hsien%22">Lien, Der-Hsien</searchLink><relatesTo>4</relatesTo><br /><searchLink fieldCode="AU" term="%22Lin%2C+Wen-Chin%22">Lin, Wen-Chin</searchLink><relatesTo>5</relatesTo><br /><searchLink fieldCode="AU" term="%22Yu%2C+Tien-Han%22">Yu, Tien-Han</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Chiu%2C+Yu-Sheng%22">Chiu, Yu-Sheng</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AU" term="%22Godwinraj%2C+D%22">Godwinraj, D</searchLink><relatesTo>6</relatesTo><br /><searchLink fieldCode="AU" term="%22Godfrey%2C+D%22">Godfrey, D</searchLink><relatesTo>3,7</relatesTo><br /><searchLink fieldCode="AU" term="%22Wu%2C+Chien-Hung%22">Wu, Chien-Hung</searchLink><relatesTo>8</relatesTo>, <i>rossiwu@chu.edu.tw</i> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Journal+of+Electronic+Materials%22">Journal of Electronic Materials</searchLink>; Feb2023, Vol. 52 Issue 2, p1391-1399, 9p |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=161192279 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1007/s11664-022-10087-x Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 9 StartPage: 1391 Titles: – TitleFull: The Impact of Hot Carrier Injection-Induced Device Degradation for Lower-Power FinFETs. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Chen, Yu-Lin – PersonEntity: Name: NameFull: Yeh, Wen-Kuan – PersonEntity: Name: NameFull: Hsu, Heng-Tung – PersonEntity: Name: NameFull: Chen, Ke-Horng – PersonEntity: Name: NameFull: Lien, Der-Hsien – PersonEntity: Name: NameFull: Lin, Wen-Chin – PersonEntity: Name: NameFull: Yu, Tien-Han – PersonEntity: Name: NameFull: Chiu, Yu-Sheng – PersonEntity: Name: NameFull: Godwinraj, D – PersonEntity: Name: NameFull: Godfrey, D – PersonEntity: Name: NameFull: Wu, Chien-Hung IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 02 Text: Feb2023 Type: published Y: 2023 Identifiers: – Type: issn-print Value: 03615235 Numbering: – Type: volume Value: 52 – Type: issue Value: 2 Titles: – TitleFull: Journal of Electronic Materials Type: main |
| ResultId | 1 |
