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In-situ scanning transmission electron microscopy study of Al-amorphous SiO2 layer-SiC interface.

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Bibliographic Details
Title: In-situ scanning transmission electron microscopy study of Al-amorphous SiO2 layer-SiC interface.
Authors: Adabifiroozjaei, Esmaeil1,2, e.adabifiroozjaei@aem.tu-darmstadt.de, Rastkerdar, Ebad3, Nemoto, Yoshihiro4, Nakayama, Yoshiko4, Nishimiya, Yuki4, Fronzi, Marco5, Yao, Yin6, Nguyen, Minh Triet7, Molina-Luna, Leopoldo1, Suzuki, Tohru S.2
Source: Journal of Materials Science; Feb2023, Vol. 58 Issue 6, p2456-2468, 13p, 7 Diagrams, 1 Graph
Database: Applied Science & Technology Source
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Description
ISSN:00222461
DOI:10.1007/s10853-023-08186-z