In-situ scanning transmission electron microscopy study of Al-amorphous SiO2 layer-SiC interface.
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| Title: | In-situ scanning transmission electron microscopy study of Al-amorphous SiO2 layer-SiC interface. |
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| Authors: | Adabifiroozjaei, Esmaeil1,2, e.adabifiroozjaei@aem.tu-darmstadt.de, Rastkerdar, Ebad3, Nemoto, Yoshihiro4, Nakayama, Yoshiko4, Nishimiya, Yuki4, Fronzi, Marco5, Yao, Yin6, Nguyen, Minh Triet7, Molina-Luna, Leopoldo1, Suzuki, Tohru S.2 |
| Source: | Journal of Materials Science; Feb2023, Vol. 58 Issue 6, p2456-2468, 13p, 7 Diagrams, 1 Graph |
| Database: | Applied Science & Technology Source |
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| FullText | Links: – Type: pdflink Text: Availability: 1 |
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| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 161769456 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: In-situ scanning transmission electron microscopy study of Al-amorphous SiO2 layer-SiC interface. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AU" term="%22Adabifiroozjaei%2C+Esmaeil%22">Adabifiroozjaei, Esmaeil</searchLink><relatesTo>1,2</relatesTo>, <i>e.adabifiroozjaei@aem.tu-darmstadt.de</i><br /><searchLink fieldCode="AU" term="%22Rastkerdar%2C+Ebad%22">Rastkerdar, Ebad</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AU" term="%22Nemoto%2C+Yoshihiro%22">Nemoto, Yoshihiro</searchLink><relatesTo>4</relatesTo><br /><searchLink fieldCode="AU" term="%22Nakayama%2C+Yoshiko%22">Nakayama, Yoshiko</searchLink><relatesTo>4</relatesTo><br /><searchLink fieldCode="AU" term="%22Nishimiya%2C+Yuki%22">Nishimiya, Yuki</searchLink><relatesTo>4</relatesTo><br /><searchLink fieldCode="AU" term="%22Fronzi%2C+Marco%22">Fronzi, Marco</searchLink><relatesTo>5</relatesTo><br /><searchLink fieldCode="AU" term="%22Yao%2C+Yin%22">Yao, Yin</searchLink><relatesTo>6</relatesTo><br /><searchLink fieldCode="AU" term="%22Nguyen%2C+Minh+Triet%22">Nguyen, Minh Triet</searchLink><relatesTo>7</relatesTo><br /><searchLink fieldCode="AU" term="%22Molina-Luna%2C+Leopoldo%22">Molina-Luna, Leopoldo</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Suzuki%2C+Tohru+S%2E%22">Suzuki, Tohru S.</searchLink><relatesTo>2</relatesTo> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Journal+of+Materials+Science%22">Journal of Materials Science</searchLink>; Feb2023, Vol. 58 Issue 6, p2456-2468, 13p, 7 Diagrams, 1 Graph |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=161769456 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1007/s10853-023-08186-z Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 13 StartPage: 2456 Titles: – TitleFull: In-situ scanning transmission electron microscopy study of Al-amorphous SiO2 layer-SiC interface. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Adabifiroozjaei, Esmaeil – PersonEntity: Name: NameFull: Rastkerdar, Ebad – PersonEntity: Name: NameFull: Nemoto, Yoshihiro – PersonEntity: Name: NameFull: Nakayama, Yoshiko – PersonEntity: Name: NameFull: Nishimiya, Yuki – PersonEntity: Name: NameFull: Fronzi, Marco – PersonEntity: Name: NameFull: Yao, Yin – PersonEntity: Name: NameFull: Nguyen, Minh Triet – PersonEntity: Name: NameFull: Molina-Luna, Leopoldo – PersonEntity: Name: NameFull: Suzuki, Tohru S. IsPartOfRelationships: – BibEntity: Dates: – D: 15 M: 02 Text: Feb2023 Type: published Y: 2023 Identifiers: – Type: issn-print Value: 00222461 Numbering: – Type: volume Value: 58 – Type: issue Value: 6 Titles: – TitleFull: Journal of Materials Science Type: main |
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