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Extreme Path Delay Estimation of Critical Paths in Within-Die Process Fluctuations Using Multi-Parameter Distributions.

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Bibliographic Details
Title: Extreme Path Delay Estimation of Critical Paths in Within-Die Process Fluctuations Using Multi-Parameter Distributions.
Authors: Runolinna, Miikka1,2, matthew.turnquist@minimaprocessor.compauliina.ilmonen@aalto.fimiikka.runolinna@aalto.fi, Turnquist, Matthew1, jukka.teittinen@minimaprocessor.com, Teittinen, Jukka1, lauri.koskinen@minimaprocessor.com, Ilmonen, Pauliina2, Koskinen, Lauri1,3
Source: Journal of Low Power Electronics & Applications; Mar2023, Vol. 13 Issue 1, p22, 14p
Database: Applied Science & Technology Source
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Description
ISSN:20799268
DOI:10.3390/jlpea13010022