APA (7th ed.) Citation

Runolinna, M., Turnquist, M., Teittinen, J., Ilmonen, P., & Koskinen, L. (2023). Extreme Path Delay Estimation of Critical Paths in Within-Die Process Fluctuations Using Multi-Parameter Distributions. Journal of Low Power Electronics & Applications, 13(1), 22. https://doi.org/10.3390/jlpea13010022

Chicago Style (17th ed.) Citation

Runolinna, Miikka, Matthew Turnquist, Jukka Teittinen, Pauliina Ilmonen, and Lauri Koskinen. "Extreme Path Delay Estimation of Critical Paths in Within-Die Process Fluctuations Using Multi-Parameter Distributions." Journal of Low Power Electronics & Applications 13, no. 1 (2023): 22. https://doi.org/10.3390/jlpea13010022.

MLA (9th ed.) Citation

Runolinna, Miikka, et al. "Extreme Path Delay Estimation of Critical Paths in Within-Die Process Fluctuations Using Multi-Parameter Distributions." Journal of Low Power Electronics & Applications, vol. 13, no. 1, 2023, p. 22, https://doi.org/10.3390/jlpea13010022.