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Extreme Path Delay Estimation of Critical Paths in Within-Die Process Fluctuations Using Multi-Parameter Distributions.

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Title: Extreme Path Delay Estimation of Critical Paths in Within-Die Process Fluctuations Using Multi-Parameter Distributions.
Authors: Runolinna, Miikka1,2, matthew.turnquist@minimaprocessor.compauliina.ilmonen@aalto.fimiikka.runolinna@aalto.fi, Turnquist, Matthew1, jukka.teittinen@minimaprocessor.com, Teittinen, Jukka1, lauri.koskinen@minimaprocessor.com, Ilmonen, Pauliina2, Koskinen, Lauri1,3
Source: Journal of Low Power Electronics & Applications; Mar2023, Vol. 13 Issue 1, p22, 14p
Database: Applied Science & Technology Source
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  Data: Extreme Path Delay Estimation of Critical Paths in Within-Die Process Fluctuations Using Multi-Parameter Distributions.
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PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=162816976
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      – Type: doi
        Value: 10.3390/jlpea13010022
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      – Code: eng
        Text: English
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        PageCount: 14
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      – TitleFull: Extreme Path Delay Estimation of Critical Paths in Within-Die Process Fluctuations Using Multi-Parameter Distributions.
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            NameFull: Runolinna, Miikka
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              M: 03
              Text: Mar2023
              Type: published
              Y: 2023
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              Value: 13
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