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Investigation of Various Commonly Associated Imperfections in Radiofrequency Micro-Electro-Mechanical System Devices and its Empirical Modeling.

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Title: Investigation of Various Commonly Associated Imperfections in Radiofrequency Micro-Electro-Mechanical System Devices and its Empirical Modeling.
Authors: Karmakar, A.1, ayan_ns@scl.gov.in, Biswas, B.2, balaka.biswas@gmail.com, Chauhan, A.K.1, akr.chauhan@gmail.com
Source: IETE Journal of Research; Apr2023, Vol. 69 Issue 4, p1995-2004, 10p
Database: Applied Science & Technology Source
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  Data: Investigation of Various Commonly Associated Imperfections in Radiofrequency Micro-Electro-Mechanical System Devices and its Empirical Modeling.
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  Data: <searchLink fieldCode="AU" term="%22Karmakar%2C+A%2E%22">Karmakar, A.</searchLink><relatesTo>1</relatesTo>, <i>ayan_ns@scl.gov.in</i><br /><searchLink fieldCode="AU" term="%22Biswas%2C+B%2E%22">Biswas, B.</searchLink><relatesTo>2</relatesTo>, <i>balaka.biswas@gmail.com</i><br /><searchLink fieldCode="AU" term="%22Chauhan%2C+A%2EK%2E%22">Chauhan, A.K.</searchLink><relatesTo>1</relatesTo>, <i>akr.chauhan@gmail.com</i>
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RecordInfo BibRecord:
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    Identifiers:
      – Type: doi
        Value: 10.1080/03772063.2021.1880342
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      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 10
        StartPage: 1995
    Titles:
      – TitleFull: Investigation of Various Commonly Associated Imperfections in Radiofrequency Micro-Electro-Mechanical System Devices and its Empirical Modeling.
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            NameFull: Karmakar, A.
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            NameFull: Biswas, B.
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            NameFull: Chauhan, A.K.
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            – D: 01
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              Text: Apr2023
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              Y: 2023
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              Value: 69
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              Value: 4
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            – TitleFull: IETE Journal of Research
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