Unusual dual optimum temperatures for ionizing radiation-induced defect generation in GLPNP bipolar transistors.

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Bibliographic Details
Title:	Unusual dual optimum temperatures for ionizing radiation-induced defect generation in GLPNP bipolar transistors.
Authors:	Zhou, Hang^1,2, Zhang, Guanghui^1,2, Duan, Binghuang^1,2, Liu, Yang^1,2, yangliuphy@gmail.com
Source:	Journal of Materials Science: Materials in Electronics; May2023, Vol. 34 Issue 13, p1-11, 11p
Database:	Applied Science & Technology Source

Description
ISSN:	09574522
DOI:	10.1007/s10854-023-10534-3