Zhou, H., Zhang, G., Duan, B., & Liu, Y. (2023). Unusual dual optimum temperatures for ionizing radiation-induced defect generation in GLPNP bipolar transistors. Journal of Materials Science: Materials in Electronics, 34(13), 1. https://doi.org/10.1007/s10854-023-10534-3
Chicago Style (17th ed.) CitationZhou, Hang, Guanghui Zhang, Binghuang Duan, and Yang Liu. "Unusual Dual Optimum Temperatures for Ionizing Radiation-induced Defect Generation in GLPNP Bipolar Transistors." Journal of Materials Science: Materials in Electronics 34, no. 13 (2023): 1. https://doi.org/10.1007/s10854-023-10534-3.
MLA (9th ed.) CitationZhou, Hang, et al. "Unusual Dual Optimum Temperatures for Ionizing Radiation-induced Defect Generation in GLPNP Bipolar Transistors." Journal of Materials Science: Materials in Electronics, vol. 34, no. 13, 2023, p. 1, https://doi.org/10.1007/s10854-023-10534-3.