Thermal environment impact on HfOx RRAM operation: A nanoscale thermometry and modeling study.
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| Title: | Thermal environment impact on HfOx RRAM operation: A nanoscale thermometry and modeling study. |
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| Authors: | West, Matthew P.1, Pavlidis, Georges2,3, Montgomery, Robert H.4, Athena, Fabia Farlin5, Jamil, Muhammad S.3, Centrone, Andrea2, Graham, Samuel3,6, Vogel, Eric M.1, eric.vogel@mse.gatech.edu |
| Source: | Journal of Applied Physics; 5/14/2023, Vol. 133 Issue 18, p1-11, 11p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00218979 |
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| DOI: | 10.1063/5.0145201 |
