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Thermal environment impact on HfOx RRAM operation: A nanoscale thermometry and modeling study.

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Title: Thermal environment impact on HfOx RRAM operation: A nanoscale thermometry and modeling study.
Authors: West, Matthew P.1, Pavlidis, Georges2,3, Montgomery, Robert H.4, Athena, Fabia Farlin5, Jamil, Muhammad S.3, Centrone, Andrea2, Graham, Samuel3,6, Vogel, Eric M.1, eric.vogel@mse.gatech.edu
Source: Journal of Applied Physics; 5/14/2023, Vol. 133 Issue 18, p1-11, 11p
Database: Applied Science & Technology Source
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  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 163802946
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Thermal environment impact on HfOx RRAM operation: A nanoscale thermometry and modeling study.
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      – Type: doi
        Value: 10.1063/5.0145201
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      – Code: eng
        Text: English
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        PageCount: 11
        StartPage: 1
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      – TitleFull: Thermal environment impact on HfOx RRAM operation: A nanoscale thermometry and modeling study.
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            NameFull: West, Matthew P.
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            NameFull: Pavlidis, Georges
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            NameFull: Athena, Fabia Farlin
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            NameFull: Jamil, Muhammad S.
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            NameFull: Centrone, Andrea
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            NameFull: Graham, Samuel
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            – D: 14
              M: 05
              Text: 5/14/2023
              Type: published
              Y: 2023
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              Value: 133
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            – TitleFull: Journal of Applied Physics
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