APA (7th ed.) Citation

Pulici, A., Kuschlan, S., Seguini, G., Taglietti, F., Fanciulli, M., Chiarcos, R., . . . Perego, M. (2023). Electrical characterization of thin silicon-on-insulator films doped by means of phosphorus end-terminated polymers. Materials Science in Semiconductor Processing, 163, N.PAG. https://doi.org/10.1016/j.mssp.2023.107548

Chicago Style (17th ed.) Citation

Pulici, Andrea, Stefano Kuschlan, Gabriele Seguini, Fabiana Taglietti, Marco Fanciulli, Riccardo Chiarcos, Michele Laus, and Michele Perego. "Electrical Characterization of Thin Silicon-on-insulator Films Doped by Means of Phosphorus End-terminated Polymers." Materials Science in Semiconductor Processing 163 (2023): N.PAG. https://doi.org/10.1016/j.mssp.2023.107548.

MLA (9th ed.) Citation

Pulici, Andrea, et al. "Electrical Characterization of Thin Silicon-on-insulator Films Doped by Means of Phosphorus End-terminated Polymers." Materials Science in Semiconductor Processing, vol. 163, 2023, p. N.PAG, https://doi.org/10.1016/j.mssp.2023.107548.