A Concurrent Built-In Self-Test Architecture Based on a Self-Testing RAM.
Saved in:
| Title: | A Concurrent Built-In Self-Test Architecture Based on a Self-Testing RAM. |
|---|---|
| Authors: | Voyiatzis, Ioannis1, Paschalis, Antonis2, Gizopoulos, Dimitris3, dgizop@unipi.gr, Kranitis, Nektarios2, Halatsis, Constantin2 |
| Source: | IEEE Transactions on Reliability; Mar2005, Vol. 54 Issue 1, p69-78, 10p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00189529 |
|---|---|
| DOI: | 10.1109/TR.2004.842091 |
