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A Concurrent Built-In Self-Test Architecture Based on a Self-Testing RAM.

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Title: A Concurrent Built-In Self-Test Architecture Based on a Self-Testing RAM.
Authors: Voyiatzis, Ioannis1, Paschalis, Antonis2, Gizopoulos, Dimitris3, dgizop@unipi.gr, Kranitis, Nektarios2, Halatsis, Constantin2
Source: IEEE Transactions on Reliability; Mar2005, Vol. 54 Issue 1, p69-78, 10p
Database: Applied Science & Technology Source
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  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 16411459
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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        Value: 10.1109/TR.2004.842091
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        Text: English
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              Text: Mar2005
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