Temperature sensitive analytical analysis of gate‐stack dual metal nanowire field‐effect transistor (4H‐SiC).

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Bibliographic Details
Title: Temperature sensitive analytical analysis of gate‐stack dual metal nanowire field‐effect transistor (4H‐SiC).
Authors: Neeraj1, s.neerumalik@gmail.com, Sharma, Shobha1, Goel, Anubha2, anubhagoel15@gmail.com, Rewari, Sonam3, Gupta, Radhey Shyam2
Source: International Journal of Numerical Modelling; Jul2023, Vol. 36 Issue 4, p1-15, 15p
Database: Applied Science & Technology Source
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ISSN:08943370
DOI:10.1002/jnm.3065